LM Gauge EVOH
LM Gauge EVOH (Barrier Layer Measurement)
This non-contact thickness measuring device is for film and sheet up to a total thickness of 3 mm. It is equipped with dual technology to measure total thicknesss and also the individual barrier layer thickness (example, EVOH, BVOH, Nylon).
Product Specification:
| Technical Data | EKO | EVOH |
|---|---|---|
| Measuring system | Capacitive/eddy current | Infrared |
| Thickness range | Up to 3 mm | > 5 µm* |
| Measuring gap | 4.4 mm | 35 mm |
| Sensor resolution | ≤ 0.1 µm | 0.5 µm |
| Repeatability | ≤ ± 0.5 µm | ≤ 2 µm* |
| Measurement speed | 10-300 mm/s adjustable | 25 mm/s adjustable |
| Calibration | necessary for each material | |
*Depending on product and calibration.
Product Features
- High precision measurement over complete lifetime:
Specialized electronics like power supply, sensors, amplifiers are engineered for precise measurement.
- Non-Radioactive
X-ray tube can be switched off. No radioactive isotope emitters
- Mechanical Structure
Heavy engineered frame to maximize precision of measurement across a variety of mechanical loads and temperature gradients.
- Range of Material
Because of simple calibration technique it is easy to calibrate across a variety of raw materials.
- No Cooling Required
Application:
- Multi layer plastic films and sheet for food packaging
Application:
- Multi layer plastic films and sheet for food packaging
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